منابع مشابه
Automated acquisition of cryo-electron micrographs for single particle reconstruction on an FEI Tecnai electron microscope.
AutoEM is a software package developed by Zhang et al. [J. Struct. Biol. 1356, 251] for semi-automated acquisition of cryo-electron micrographs from Tecnai series electron microscopes and is used frequently at the lowest level of automation. We report here on the new progress that we have made based on their preliminary work. A fourth low-dose state is created where the system can pre-select al...
متن کاملPetr Jančar FEI
1 RSA-cryptosystem, and the underlying theory The aim of this section is to recall the RSA cryptographic method and the necessary theory showing its correctness, computational complexity, etc. 1.1 Creating an RSA system RSA (Rivest, Shamir, Adleman) is a particular method which can be used for the public-key cryptography. A concrete RSA system is created as follows: 1. Choose randomly two diffe...
متن کاملAutofocus and two-fold astigmatism correction in HAADF-STEM
A new simultaneous autofocus and two-fold astigmatism correction method is proposed for High Angle Annular Dark Field Scanning Transmission Electron Microscopy (HAADF-STEM). The method makes use of a modification of an image variance, which has already been used before as an image quality measure for different types of microscopy. In this paper we describe numerical simulations based on a class...
متن کاملEffects of Electron-Gun and Laser Parameters on Collection Efficiency and Packet Duration in Ultrafast Electron Microscopy
Real-space imaging of full-morphological, angstrom-scale structural dynamics occurring on the femtosecond (fs) timescale is possible with ultrafast electron microscopy (UEM) via the stroboscopic pump-probe methodology enabled by interfacing an otherwise standard TEM with a short-pulsed laser system [1-3]. The technology has matured to the point that commercial systems, such as the FEI Tecnai Fe...
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ژورنال
عنوان ژورنال: Journal of large-scale research facilities JLSRF
سال: 2016
ISSN: 2364-091X
DOI: 10.17815/jlsrf-2-138